Rsuwei

What Is On Wafer

waht is on wafer 介绍

What is On Wafer Temperature Measurement System?

 

The Wireless On-Wafer Temperature Measurement System is a groundbreaking innovation in semiconductor manufacturing, designed to measure and record the impact of the dry etch process environment on production wafers. Embedded directly in a wafer, this advanced system offers unparalleled insights under actual process conditions, eliminating the need for wired connections.

Key Features

Wireless Monitoring: Embedded in the wafer, our system enables real-time, wireless temperature monitoring during the dry etch process, providing accurate and immediate data without cumbersome wires.

Comprehensive Data Collection: Measure and record temperature data under conditions identical to the product process, ensuring the most relevant and actionable insights.

Process Calibration: Designed to help process engineers calibrate etch process conditions, ensuring optimal performance and uniformity across the wafer.

Uniformity Improvement: Enhance the uniformity of temperature profiles, leading to consistent and high-quality production outcomes.

Chamber Matching: Verify and match the temperature profiles of different etch chambers, ensuring consistent performance across all processing equipment.

Post-Maintenance Validation: Validate process conditions and performance after preventive maintenance (PM), reducing downtime and ensuring optimal operation.

Benefits

Precision Control:

Achieve unparalleled precision in temperature measurement, enabling fine-tuning of etch process conditions for optimal results.

Enhanced Uniformity:

Improve the uniformity of temperature profiles across the wafer, leading to more consistent and reliable production outcomes.

Real-Time Data:

Access real-time temperature data during the dry etch process, allowing for immediate adjustments and optimizations.

Increased Efficiency:

Streamline the calibration, verification, and validation processes, reducing downtime and increasing overall production efficiency.

Quality Assurance:

Ensure that all etch chambers perform consistently, enhancing the quality and reliability of your semiconductor devices.

Applications

Etch Process Calibration:

Adjust and fine-tune etch process conditions based on accurate, real-time temperature data.

Chamber Matching:

Match temperature profiles between different etch chambers to ensure uniform performance.

Post-Maintenance Validation:

Validate process conditions after preventive maintenance to ensure optimal equipment performance.

Contact Us

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FAQ

Yes. Define each length of L1, L2, L3 ( Mainly consider the length that TC-wafer placed in the chamber)

Yes. We provide flexible customization service to meet our client’s needs.

Not really the same. The temperature in process should be consider when choosing the correct item. For example, TC-wafer can test within 1200℃, but On Wafer system can only test under 100℃.