Rsuwei

AMS Wafer

AMS wafer无线校准测量系统

AMS Wafer - Auto Muti-Sensors

  • Measurement type: Acceleration, leveling angle, humidity and temperature
  • Wafer Size: 200mm, 300mm
  • Horizontal angle: X,Y,±45°(±0.05°)
  • Sampling method: Continuous sampling 5Hz



AMS Wafer -Auto Multi-Sensors 

Product Introduction

The AMS Wafer (Auto Multiple Sensor) is a unique tool that integrates multiple sensor modules onto a single circuit board. This allows it to quickly measure vibration, acceleration, level, and humidity, making it a versatile and efficient solution for semiconductor equipment debugging.

Wafer transfer measurement is performed at locations such as the robot. AMS Wafer can calculate its acceleration during the transfer process, and also can measure the temperature and humidity inside the chamber.

Specifications

Software demostration Interface

 No.

Item

Specification

1

Measurement type

Acceleration, leveling angle, humidity and temperature

2

Sampling rate

10Hz

3

Measurement range

Horizontal angle: X,Y,±45°(±0.05°)

4

Acceleration:±2g

5

Temperature: 0℃-80℃ (±0.3℃ )

6

Humidity: 0%RH-100%RH (±2%RH)

7

Connection type

Bluetooth 

8

Size

200mm、300mm (8”, 12”)

9

Weight

Approx. 200g

10

Sampling method

Continuous sampling 5Hz

 

Applications

Wafer transfer measurement is performed at locations such as the robot. AMS Wafer can calculate its acceleration during the transfer process, and also can measure the temperature and humidity inside the chamber, making it a versatile and efficient solution for semiconductor equipment debugging.

Contact Us

Send us an inquiry! We will reply within 24 hours!

Please enable JavaScript in your browser to complete this form.

FAQ

Yes. Define each length of L1, L2, L3 ( Mainly consider the length that TC-wafer placed in the chamber)

Yes. We provide flexible customization service to meet our client’s needs.

Not really the same. The temperature in process should be consider when choosing the correct item. For example, TC-wafer can test within 1200℃, but On Wafer system can only test under 100℃.